S06 ORT History
Category: Autre
mise à jour avec succès: 1 déc. 2017
Auteurs
Created byValen Hung
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Les événements
TAO Chamber Temperature runaway 4h15mProvide All S/N of Tin Can/Tin Cards and OBOs.1) Quote was provided by GF for long term protection plan.
2) OBO loopback was swapped for T0 OBO-0
verification under room temp. testing.6 TiN Card GNET failed on the same period on 21:30 and 22:30, It is new finding we’ve never ever seen it before.Périodes
1st Run ORT with room temp. and all results positive2nd & 3rd Run ORT for QSFP PRBS verification. Temp. is not a troubling fact.4th Run ORT with Thermal + Power cycling profile.
OBO and DDR and QSFP are major issue.Short term protection trail run are good for solution implementation at TAO and iPT both.5th and 6th Run ORT for T0 OBO-0 hard module verification. Issue cannot duplicated.
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